Electronics school training courses in Chandler, AZ.
An index of public, in-house or online Electronics training programs in Chandler
United States
Worldwide > United States > Arizona > Chandler

Electronics school training courses in Chandler, AZ (public, in-house or online)



Aviation Electronics Maintenance

School: Chandler-Gilbert Community College
Venue: Chandler
Tel.: 480.732.7000

aviation electronics maintenance training courses and programs are available at chandler-gilbert community college in Chandler, or it can provide customized training on your request. Please visit the official website of chandler-gilbert community college or call 480.732.7000 for details.

Official Website: http://www.cgc.maricopa.edu/
Test Methodologies
Format: Online

School: Semitracks, Inc.
Venue: Albuquerque
Tel.: 1-505-858-0454

This course material covers test methodologies for ICs. It includes information on digital testing, current testing, and timing tests. All three are useful to help localize defects and other problems on circuits prior to shipping them to the customer.

Test Process Basics

Test process basics provides an overview of the test process and how defect-based test fits into it. This section covers the development of the test set from design through to production and the various components ...

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Test Basics
Format: Online

School: Semitracks, Inc.
Venue: Albuquerque
Tel.: 1-505-858-0454

This material covers basic issues in test. Currently, this course contains an introduction to automatic test and an overview of boundary scan test techniques.

Automatic Testing Overview

This section introduces the concept of automatic testing of integrated circuits. It provides an overview of why testing is performed, and the equipment used to test ICs.
Boundary Scan Overview

This section introduces the boundary scan standard (IEEE 1149.1). It explains the use of boundary...

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Defect Based Testing
Format: Online

School: Semitracks, Inc.
Venue: Albuquerque
Tel.: 1-505-858-0454

Defect-based testing is the practice of testing with the idea of detecting defective conditions on complex ICs. Defect-based testing moves beyond functional and structural testing by introducing test concepts to catch actual defects. Many defects are not easily caught with standard test techniques, and require additional test approaches. Defect-based testing incorporates knowledge of defects like opens, shorts, resistive connections, parametric anomalies, and process variation-induced problems. ...

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Memory Technology
Format: Online

School: Semitracks, Inc.
Venue: Albuquerque
Tel.: 1-505-858-0454

This material covers the technology of memory ICs. Memory is ubiquitous in today’s electronic systems. There are several types of memory: dynamic random access memory (DRAM), static random access memory (SRAM), and non-volatile memory (NVM). Each has its advantages and disadvantages, and each has different design and manufacturing techniques.

Memory Technology Overview

This section provides an overview of memory technology. It covers Dynamic Random Access Memory (DRAM), Static...

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