VLSI school training courses in Albuquerque, NM (public, in-house or online)

Introduction to the principles and design techniques of very large scale integrated circuits (VLSI). Topics include MOS transistor characteristics, DC analysis, resistance, capacitance models, transient analysis, propagation delay, power dissipation, CMOS logic design, transistor sizing, layout methodologies, clocking schemes, case studies. Students will use VLSI CAD tools for layout, and simulation.

The M.S. in Electrical Engineering (VLSI Design) is an area of emphasis for the electrical engineering student interested in the current and expanding field of VLSI circuit design.

Available On-Campus and Online
In addition to our traditional on-campus classroom environment, this program is also available via online delivery through the Viterbi School’s Distance Education Network (DEN). This flexible option is ideal for engineering professionals who choose to pursue an advanced degree ...

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This material covers the topic of Yield Analysis and Modeling. Yield is a critical aspect of the semiconductor manufacturing process. High yielding components are necessary for profits and success at Foundries as well as the Integrated Device Manufacturers. This material covers the Principles and Procedures of Yield Analysis, Yield Analysis Techniques, Yield Modeling, Data Mining, and Yield Enhancement Techniques.

This course material covers test methodologies for ICs. It includes information on digital testing, current testing, and timing tests. All three are useful to help localize defects and other problems on circuits prior to shipping them to the customer.

Test Process Basics

Test process basics provides an overview of the test process and how defect-based test fits into it. This section covers the development of the test set from design through to production and the various components ...

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This material covers basic issues in test. Currently, this course contains an introduction to automatic test and an overview of boundary scan test techniques.

Automatic Testing Overview

This section introduces the concept of automatic testing of integrated circuits. It provides an overview of why testing is performed, and the equipment used to test ICs.
Boundary Scan Overview

This section introduces the boundary scan standard (IEEE 1149.1). It explains the use of boundary...

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